Structural and optical properties of ZnO films obtained on mesoporous Si substrates by the method of HF magnetron sputtering

dc.contributor.authorKIDALOV, VALERIY
dc.contributor.authorКідалов, Валерій Віталійович
dc.contributor.authorDYADENCHUK, ALENA
dc.contributor.authorДяденчук, Альона Федорівна
dc.contributor.authorBACHERIKOV, YURIY
dc.contributor.authorZHUK, ANTON
dc.contributor.authorGORBANIUK, TETYANA
dc.contributor.authorROGOZIN, Igor
dc.contributor.authorKIDALOV, Vitali
dc.date.accessioned2024-06-16T20:33:33Z
dc.date.available2024-06-16T20:33:33Z
dc.date.issued2020
dc.description.abstractENG : In the present work, ZnO films were obtained on mesoporous silicon substrates by the method of HF magnetron sputtering of a metallic zinc target in reaction oxygen and argon gas medium. The properties of the ZnO films obtained on mesoporous substrates were studied depending on the ratio of the partial pressures of the working gases (argon/oxygen). X-ray analysis showed that in the process of deposition, the ZnO films of a hexagonal structure were formed. The effect of the porous layer on the structural and luminescent properties of the thin ZnO films was studied. The results showed that the porous silicon substrate reduces residual stresses and can be used for obtaining high-quality ZnO filmsuk
dc.identifier.citationStructural and optical properties of ZnO films obtained on mesoporous Sisubstrates by the method of HF magnetron sputtering. V. Kidalov, A. Dyadenchuk, Y. Bacherikov et al.; Turkish Journal of Physics, 2020, 44: pp. 57 – 66. References 30uk
dc.identifier.doidoi:10.3906/fiz-1909-10uk
dc.identifier.urihttp://elar.tsatu.edu.ua/handle/123456789/17672
dc.language.isoenuk
dc.subjectZnO filmuk
dc.subjectporous Siuk
dc.subjectHF magnetron sputteringuk
dc.titleStructural and optical properties of ZnO films obtained on mesoporous Si substrates by the method of HF magnetron sputteringuk
dc.typeArticleuk

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