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Please use this identifier to cite or link to this item: http://elar.tsatu.edu.ua/handle/123456789/17672
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dc.contributor.authorKIDALOV, VALERIY-
dc.contributor.authorКідалов, Валерій Віталійович-
dc.contributor.authorDYADENCHUK, ALENA-
dc.contributor.authorДяденчук, Альона Федорівна-
dc.contributor.authorBACHERIKOV, YURIY-
dc.contributor.authorZHUK, ANTON-
dc.contributor.authorGORBANIUK, TETYANA-
dc.contributor.authorROGOZIN, Igor-
dc.contributor.authorKIDALOV, Vitali-
dc.date.accessioned2024-06-16T20:33:33Z-
dc.date.available2024-06-16T20:33:33Z-
dc.date.issued2020-
dc.identifier.citationStructural and optical properties of ZnO films obtained on mesoporous Sisubstrates by the method of HF magnetron sputtering. V. Kidalov, A. Dyadenchuk, Y. Bacherikov et al.; Turkish Journal of Physics, 2020, 44: pp. 57 – 66. References 30uk
dc.identifier.urihttp://elar.tsatu.edu.ua/handle/123456789/17672-
dc.description.abstractENG : In the present work, ZnO films were obtained on mesoporous silicon substrates by the method of HF magnetron sputtering of a metallic zinc target in reaction oxygen and argon gas medium. The properties of the ZnO films obtained on mesoporous substrates were studied depending on the ratio of the partial pressures of the working gases (argon/oxygen). X-ray analysis showed that in the process of deposition, the ZnO films of a hexagonal structure were formed. The effect of the porous layer on the structural and luminescent properties of the thin ZnO films was studied. The results showed that the porous silicon substrate reduces residual stresses and can be used for obtaining high-quality ZnO filmsuk
dc.language.isoenuk
dc.subjectZnO filmuk
dc.subjectporous Siuk
dc.subjectHF magnetron sputteringuk
dc.titleStructural and optical properties of ZnO films obtained on mesoporous Si substrates by the method of HF magnetron sputteringuk
dc.typeArticleuk
local.identifier.doidoi:10.3906/fiz-1909-10uk
Appears in Collections:Кафедра Вища математика та фізика

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